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Method Guide

FET/TFT extraction guide

FET/TFT is the main platform workflow. SCLC is retained below as an additional tool.

Main method

FET/TFT

Analyze

When to use

Transistor devices with transfer curves or 4PP conductance curves.

Required data

linear: VG + ID; saturation: VG + ID; 4PP: VG + G4PP.

Required metadata

linear: W, L, Ci, VDS; saturation: W, L, Ci; 4PP: W, D4PP, Ci. Ci is normalized internally to F/m².

Formula path

Linear windows fit |ID| versus VG; saturation windows fit √|ID| versus VG. Multiple current-dynamic-range scales are tested, every window uses all contained points, and mobility magnitude never decides the recommended window. 4PP retains its conductance fit.

Audit output

A/B/C/D curve-evidence grade; recommended or limited-evidence mobility; r = recommended mobility / the P90 of qualified windows in the same stable plateau, balanced across current position and window scale; no current multiplier is privileged; the absolute maximum remains a separate diagnostic; selected current and VG ranges, points, fit interval, endpoint sensitivity, residual and slope-stability checks, cross-scale evidence, sweep difference, warnings, and provenance.

Caveats

A and B support a recommendation; C gives a limited reference value; D gives no single mobility. The grade evaluates this curve only. The result remains apparent two-probe mobility and cannot remove contact, ionic or digitisation effects.

Additional tool

SCLC

Analyze

When to use

Vertical single-carrier devices with a J-V curve that can be evaluated against a Mott-Gurney-like regime.

Required data

voltage + current_density, or voltage + current with device area.

Required metadata

active-layer thickness L, relative dielectric constant εr, and device area A when current must be converted to current density.

Formula path

Fit J versus V² in the selected SCLC-like region, then invert the Mott-Gurney relation for apparent SCLC mobility.

Audit output

fitting range, logJ-logV slope, J-versus-V² fit, R², point count, warnings, credibility, comparability, and provenance.

Caveats

The result depends on correct metadata, physical-regime selection, and data quality. Cross-protocol comparison is not implied.